Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2005.07a
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- Pages.99-100
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- 2005
Study on the analyzing method for examine the thyristor characteristic degradation due to the aging
Thyristor소자의 열화에 따른 특성저하 분석기법에 관한 연구
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Kim, Hyoung-Woo
(Korea Electrotechnology Research Institute)
;
-
Seo, Kil-Soo
(Korea Electrotechnology Research Institute)
;
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Kim, Ki-Hyun
(Korea Electrotechnology Research Institute)
;
- Lee, Yang-Jae (JinJu National University) ;
- Choi, Nak-Kwon (Kyoung Nam University) ;
-
Kim, Eun-Dong
(Korea Electrotechnology Research Institute)
- Published : 2005.07.07
Abstract
Reliability of the thyristor has a major effects on the high power systems such as HVDC, SVC and FACTs, etc. Therefore, analyzing method for thyristor aging is important to improve the stability of thyristor and high power systems. In this paper, we explain the analyzing method for examine the thyristor aging effect. And also, the thyristor aging experiments were performed to investigate the characteristic degradation due to the aging.