Analysis of the relationship between breakdown voltage and defect of thyristor

사이리스터의 결함과 항복전압의 관계 분석

  • Published : 2005.07.07

Abstract

Thyristor breakdown voltage variation acceleration aging test was investigated. The breakdown voltage was deceased after 1000 hours acceleration aging test. It temperature rising caused by electric field concentration at the edge beveling region of the thyristor was confirmed using Silvaco device simulation. The local temperature rising is driving force for the defect propagation. Consequently, propagated defects of the beveling region seems to decrease thyristor's breakdown voltage.