Reproducible Resistance Switching in NiO Films for ReRAM Applications

ReRAM 응용을 위한 NiO 박막의 저항 변화 특성

  • Park, Jae-Wan (Thin Films Materials Research Center, KIST, Division of Materials Science and Engineering, Hanyang University) ;
  • Park, Jong-Wan (Division of Materials Science and Engineering, Hanyang University) ;
  • Yang, Min-Kyu (Thin Films Materials Research Center, KIST) ;
  • Jung, Kyu-Ho (Thin Films Materials Research Center, KIST) ;
  • Kim, Dal-Young (Thin Films Materials Research Center, KIST) ;
  • Lee, Jeon-Kook (Thin Films Materials Research Center, KIST)
  • Published : 2005.05.26