Omega 형태의 게이트를 갖는 ZnO 나노선 FET에 대한 연구

A study for omega-shaped gate ZnO nanowire FET

  • 김기현 (고려대학교 전기전자전파공학과) ;
  • 강정민 (고려대학교 전기전자전파공학과) ;
  • 윤창준 (고려대학교 전기전자전파공학과) ;
  • 정동영 (고려대학교 나노중점연구소) ;
  • 김상식 (고려대학교 전기전자전파공학과)
  • 발행 : 2006.07.12

초록

Omega-shaped-gate (OSG) nanowire-based field effect transistors (FETs) have been attracted recently attention due to their highdevice performance expected from theoretical simulations among nanowire-based FETs with other gate geometries. OSG FETs with the channels of ZnO nanowires were successfully fabricated in this study with photolithographic processes. In the OSG FETs fabricated on oxidized Si substrates, the channels of ZnO nanowires with diameters of about 60 nm are coated surroundingly by $Al_{2}O_{3}$ as gate dielectrics with atomic layer deposition. About 80 % of the surfaces of the nanowires coated with $Al_{2}O_{3}$ is covered with gate metal to form OSG FETs. A representative OSG FET fabricated in this study exhibits a mobility of 98.9 $cm^{2}/Vs$, a peak transconductance of 0.4 ${\mu}S$, and an Ion/Ioff ratio of $10^6$ the value of the Ion/Ioff ratio obtained from this OSG FET is the highest among nanowire-based FETs, to our knowledge. Its mobility, peak transconductance, and Ion/Ioff ratio arc remarkably enhanced by 11.5, 32, and $10^6$ times, respectively, compared with a back-gate FET with the same ZnO nanowire channel as utilized in the OSG FET.

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