A Defect Diagnosis of Polymer Insulator using Shearographic system

Shearographic system을 이용한 폴리머애자 결함 진단

  • 김수길 (호서대학교 전기정보통신공학부) ;
  • 고명숙 (부천대학 전산정보처리과)
  • Published : 2006.05.11

Abstract

We present the method to obtain four speckle patterns with relative phase shift of $\pi/2$ by passive devices such as wave plate and polarizer, and calculate the phase at each point of the speckle pattern in shearographic system using Wollaston in And, to demonstrate the feasibility of the proposed system, we present the experimental results using polymer insulator.

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