Exchange bias field change of FeMn/NiFe bilayer thin films by He ion irradiation

  • Noh, Y.O. (Dept. of Materials Engineering, Chungnam National University) ;
  • Kim, C.G. (Dept. of Materials Engineering, Chungnam National University) ;
  • Kim, C.O. (Dept. of Materials Engineering, Chungnam National University)
  • 발행 : 2006.11.23