Modeling of the defect on the slit in Patterned Vertical Aligned (PVA) LC Cell using the fast Q-tensor method

  • Son, Jung-Hee (Department of Electronics Engineering, Dong-A University) ;
  • Choi, Yong-Hyun (Department of Electronics Engineering, Dong-A University) ;
  • Lee, Wa-Ryong (Department of Electronics Engineering, Dong-A University) ;
  • Choi, Seong-Wook (Department of Electronics Engineering, Dong-A University) ;
  • Kim, Kyung-Mi (Department of Electronics Engineering, Dong-A University) ;
  • Hue, Tae-Kyung (Department of Electronics Engineering, Dong-A University) ;
  • Yang, Jin-Seok (Department of Electronics Engineering, Dong-A University) ;
  • Lee, Seung-Hee (School of Advanced Materials Engineering, Chonbuk National University) ;
  • Lee, Gi-Dong (Department of Electronics Engineering, Dong-A University)
  • Published : 2006.08.22

Abstract

In this paper we model the liquid crystal director field in the Patterned Vertical Alignment (PVA) LC using the fast Q-tensor method, which can model multidimensional director configurations with defects in the liquid crystal director field. We observed the dynamic behaviors of the defect experimentally by applying the voltage and modeled the LC director field with defect in the active area of the PVA cell. As a result, we could also calculate the optical transmittance.

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