Mechanism analysis of Scintillation in Rear Projection TVs

  • KAGOTANI, Akihito (Optical Device Research Laboratory Technical Research Institute Toppan Printing Co., Ltd.) ;
  • KAIZUKA, Tomoyoshi (Optical Device Research Laboratory Technical Research Institute Toppan Printing Co., Ltd.) ;
  • IWATA, Satoshi (Optical Device Research Laboratory Technical Research Institute Toppan Printing Co., Ltd.) ;
  • SHIMIZU, Yuichiro (Optical Device Research Laboratory Technical Research Institute Toppan Printing Co., Ltd.) ;
  • MORONAGA, Kohei (Optical Device Research Laboratory Technical Research Institute Toppan Printing Co., Ltd.) ;
  • TAKAHASHI, Susumu (Optical Device Research Laboratory Technical Research Institute Toppan Printing Co., Ltd.) ;
  • MASUTOMI, Osamu (Optical Device Research Laboratory Technical Research Institute Toppan Printing Co., Ltd.)
  • Published : 2006.08.22

Abstract

Scintillation that is grainy patterns appeared on a screen has been one of a biggest issues in a rear projection TVs. In this paper, with focusing on the average size of random particle, it was proved that the particle size of calculated speckle and the one of measured scintillation are almost the equal. This result shows speckle phenomenon is an important factor of scintillation.

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