한국정보디스플레이학회:학술대회논문집
- 2006.08a
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- Pages.1447-1450
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- 2006
Novel high speed and sensitivity array test system for LTPS LCD and OLED
- Chikamatsu, Kiyoshi (Agilent Technologies International Japan, Ltd.) ;
- Miyake, Yasuhiro (Agilent Technologies International Japan, Ltd.) ;
- Tajima, Kayoko (Agilent Technologies International Japan, Ltd.) ;
- Goto, Masaharu (Agilent Technologies International Japan, Ltd.) ;
- Mizoguchi, Junichi (Agilent Technologies International Japan, Ltd.)
- Published : 2006.08.22
Abstract
The high speed and sensitivity array test system has been developed and utilized for massproduction of advanced LTPS displays including SOG and OLED. It realizes fast enough TACT enabling 100% inspection with better than 1fF sensitivity. The result of actual measurement shows its superior TACT and sensitivity, and also shows MURA detection of OLED panel.
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