Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2006.11a
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- Pages.43-44
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- 2006
Reducing of cross-talk by patterning of common electrode in the patterned vertical alignment (PVA) mode
PVA모드에서 공통 전극 패턴을 통한 전기장 간섭의 감소 효과
- Jeon, Yeon-Mun (Chonbuk National University) ;
- Kim, Youn-Sik (Chonbuk National University) ;
- Hwang, Seong-Jin (Chonbuk National University) ;
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Lee, Seung-Hee
(Chonbuk National University)
;
- Lyu, Jae-Jin (Samsung Electronics LCD) ;
- Kim, Kyeong-Hyeon (Samsung Electronics LCD)
- Published : 2010.04.01
Abstract
We have studied electro-optical characteristics and stability of liquid crystal director depending on electrode patterning of common electrode on top substrate in patterned vertical alignment (PVA) mode. In the present studies, new type of common electrode pattern was suggested to enhance a dark state by reducing interference area due to data signal. According to the simulation result, PVA device with new common electrode pattern contributed to Improvement of an aperture ratio.