The Properties of Devices Surface by Fractal Dimension

프랙탈 차원에 의한 소자 표면의 특성

The surface properties of electrical devices studied by fractal phenomenon were investigated. The SEM photographs of devices surface were changed by binary code and it were analyzed by fractal dimension. The void of devices surface was found by fractal program. The relation between grain density and electrical properties are able to expect to fractal dimension. The grain size in varistors surface was decreased by increasing of oxide antimony addition. The fractal dimension and electrical properties of devices surface was related to between grain boundary and grain density. The grain size was decreased by increasing of fractal dimensions.