Fabrication and characteristics of low temperature poly-Si thin film transistor using Polymer Substrates

저온에서 제작된 고분자 기판 위의 poly-si TFT 제조 및 특성

  • Published : 2006.04.28

Abstract

In this paper, the characteristics of polycrystalline silicon thin-film transistors (poly-Si TFTs) fabricated on polymer substrates are investigated. The a-Si films was laser annealed by using a XeCl excimer laser and a four-mask-processed poly-Si TFT was fabricated with fully self-aligned top gate structure. The fabricated nMOS TFT showed field-effect mobility of $30cm2/V{\cdot}s$, on/off ratio of 105 and threshold voltage of 5 V.

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