한국전기전자재료학회:학술대회논문집 (Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference)
- 한국전기전자재료학회 2007년도 추계학술대회 논문집
- /
- Pages.362-363
- /
- 2007
Measurement of Drifting Mobility and Transit Time of Holes and Electrons in Stabilized a-Se Film
- Kim, Jae-Hyung (School of Computer Aided Science, Inje University) ;
- Park, Chang-Hee (Dept. of Radiologic Technology, Daegu health College) ;
- Nam, Sang-Hee (Medical Image Research Lab., Inje University)
- 발행 : 2007.11.01
초록
The transport property of stabilized amorphous selenium typical of the material used in direct conversion x-ray imaging devices was studied using the moving photo-carrier grating (MPG) technique and time-of-flight (TOF) measurements. For MPG measurement, the electron and hole mobility, and recombination lifetime of a-Se films with arsenic (As) additions have been obtained. For TOF measurement, a laser beam with pulse duration of 5ns and wavelength of 350 nm was illuminated on the surface of a-Se with thickness of
키워드