Characterization of FePt Sputtered Films by Post-annealing: A Study of X-ray Specular Reflectivity

  • Hsiao, S.N. (Department of Materials science and Engineering, Feng Chia University (FCU)) ;
  • Chen, S.K. (Department of Materials science and Engineering, Feng Chia University (FCU)) ;
  • Hsu, Y.W. (Department of Materials science and Engineering, Feng Chia University (FCU)) ;
  • Huang, H.W. (Department of Materials science and Engineering, Feng Chia University (FCU)) ;
  • Yuan, F.T. (Institute of Physics, Academia Sinica) ;
  • Lee, H.Y. (National Sychrotron Radiation Reseach Center (NSRRC)) ;
  • Chang, W.C. (Department of Phyics, National Chung Cheng University)
  • Published : 2007.05.28