Characterization of Ultra-thin Fe Films Grown on MgO(100) by Magnetoresistance Measurement

  • Kim, Y.H. (Institute for Materials Research, Tohoku University) ;
  • Hagiuda, M. (Institute for Materials Research, Tohoku University) ;
  • Mitani, S. (Institute for Materials Research, Tohoku University) ;
  • Takanashi, K. (Institute for Materials Research, Tohoku University)
  • Published : 2007.05.28