Thickness-dependent morphology of ZnO films and amorphous ZnO Transparent TFT

  • Hsieh, Hsing-Hung (Graduate Institute of Electronics Engineering, Graduate Institute of Electrooptical Engineering, and Department of Electrical Engineering, National Taiwan University) ;
  • Wu, Chung-Chih (Graduate Institute of Electronics Engineering, Graduate Institute of Electrooptical Engineering, and Department of Electrical Engineering, National Taiwan University)
  • 발행 : 2007.08.27

초록

Thickness dependent morphology of ZnO films was studied, and ZnO can be intentionally grown into amorphous phase by reducing the thickness. The top-gate amorphous ZnO TTFTs with rather high field-effect mobilities and on/off current ratios were effectively fabricated.

키워드