대한전기학회:학술대회논문집 (Proceedings of the KIEE Conference)
- 대한전기학회 2008년도 학술대회 논문집 정보 및 제어부문
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- Pages.145-146
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- 2008
정확한 비전 검사를 위한 히스토그램 지정 기법 개발
Histogram Specification Method Development for Accurate Visual Inspection
- Park, Se-Hyuk (Dankook University, Electronic Engineering) ;
- Kang, Su-Min (Dankook University, Electronic Engineering) ;
- Han, Kwang-Hee (Dankook University, Electronic Engineering) ;
- Huh, Kyung-Moo (Dankook University, Electronic Engineering)
- 발행 : 2008.10.31
초록
The appearance inspection of various electronic products and parts has been executed by the eyesight of human. But inspection by eyesight cannot bring about uniform inspection result. Because the appearance inspection result by eyesight of human is changed by condition of physical and spirit of the checker. So machine vision inspection system is currently used to many appearance inspection fields instead of the checker. However the inspection result of machine vision is changed by the illumination of workplace. Therefore we proposed histogram specification in this paper for machine vision inspection accuracy. As a result of histogram specification algorithm, we could increase the exactness of visual inspection and prevent system error from physical and spirit condition of human. More specifically, average inspection error rate was 7.5[%] in existing inspection method but we could see 0.6[%] error rate after applying the algorithm which is presented in this paper.