한국정보디스플레이학회:학술대회논문집
- 2008.10a
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- Pages.201-204
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- 2008
A New I-V Equation for Thin Film Transistors and Its Parameter Extraction Method
- Jung, Keum-Dong (Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Computer Science, Seoul National University) ;
- Kim, Yoo-Chul (Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Computer Science, Seoul National University) ;
- Park, Byung-Gook (Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Computer Science, Seoul National University) ;
- Shin, Hyung-Cheol (Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Computer Science, Seoul National University) ;
- Lee, Jong-Duk (Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Computer Science, Seoul National University)
- Published : 2008.10.13
Abstract
Based on the device physics, a new I-V equation for TFTs is derived and a simple parameter extraction method is suggested. The new method gives more physically meaningful threshold voltage and mobility, and the obtained values can be directly used for the TFT device modeling.