한국정보디스플레이학회:학술대회논문집
- 한국정보디스플레이학회 2008년도 International Meeting on Information Display
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- Pages.488-491
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- 2008
New Metric For Short-Range Uniformity of AMOLEDs
- Arkhipov, Alexander (LCD Business Unit, Samsung Electronics Corp.) ;
- Lee, Baek-Woon (LCD Business Unit, Samsung Electronics Corp.) ;
- Park, Kyong-Tae (LCD Business Unit, Samsung Electronics Corp.) ;
- Kim, Chi-Woo (LCD Business Unit, Samsung Electronics Corp.) ;
- Lee, Jin-Seok (LCD Business Unit, Samsung Electronics Corp.)
- 발행 : 2008.10.13
초록
The variations of the TFT characteristics in AMOLEDs result in the decrease of the uniformity of the displays. Measurement of the long-range uniformity (LRU) is straightforward. However, there is no method for measuring the short-range uniformity (SRU) yet. Quantifying the SRU is important in evaluating various TFT backplanes and compensation circuits. We propose new methods for measuring SRU.