한국정보디스플레이학회:학술대회논문집

The Korean Infomation Display Society (한국정보디스플레이학회)
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Rapid Calibration of Organic Layer Thickness by ETFOS software

  • Juang, Fuh-Shyang (Institute of Electro-optical and Materials Science, National Formosa University) ;
  • Huang, Jian-Ji (Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University) ;
  • Wang, Shun-Hsi (Institute of Electro-optical and Materials Science, National Formosa University) ;
  • Liu, Yi-Hsien (Institute of Electro-optical and Materials Science, National Formosa University) ;
  • Su, Yan-Kuin (Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University)
  • Published : 2008.10.13
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Abstract

By ETFOS software simulation to swiftly find out the shortcomings of the device structure and conserve the wastage of time cost in experiments, including the instruments deviations or human errors. Thereby we can calibrate the correct organic layer thickness by comparing the EL spectra with different NPB thicknesses.

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