한국정보디스플레이학회:학술대회논문집

The Korean Infomation Display Society (한국정보디스플레이학회)
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Influence of Silicon and Seed Particles on the Reconstruction Characteristics and Exaggerated Grain Growth of MgO Protective Layer by Over-Frequency Accelerated Discharge in ACPDPs

  • Kwon, Sang-Koo (Materials Characterization Group, Device & Materials Laboratory, LG Electronics Advanced Research Institute (LGEARI)) ;
  • Kim, Jeong-Ho (Materials Characterization Group, Device & Materials Laboratory, LG Electronics Advanced Research Institute (LGEARI)) ;
  • Moon, Seung-Kyu (Materials Characterization Group, Device & Materials Laboratory, LG Electronics Advanced Research Institute (LGEARI)) ;
  • Choi, Jong-Kwon (Materials Characterization Group, Device & Materials Laboratory, LG Electronics Advanced Research Institute (LGEARI)) ;
  • Park, Kyu-Ho (Materials Characterization Group, Device & Materials Laboratory, LG Electronics Advanced Research Institute (LGEARI)) ;
  • Han, Sung-Su (Materials Characterization Group, Device & Materials Laboratory, LG Electronics Advanced Research Institute (LGEARI))
  • Published : 2008.10.13
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Abstract

The influences of silicon and MgO seed particle on the reconstruction characteristics of MgO protective layer were investigated to clarify the mechanism of reconstruction and exaggerated grain growth (EGG) in AC-PDP. The reconstruction and EGG are closely correlated with the driving force for nucleation and growth, interface energy and initial size distribution of MgO protective layer in plasma space during discharge in AC-PDP.

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