Threshold Voltage Instability in a-Si:H TFTs and the Implications for Flexible Displays and Circuits

  • Allee, D.R. (Flexible Display Center at Arizona State University) ;
  • Venugopal, S.M. (Flexible Display Center at Arizona State University) ;
  • Shringarpure, R. (Flexible Display Center at Arizona State University) ;
  • Kaftanoglu, K. (Flexible Display Center at Arizona State University) ;
  • Uppili, S.G. (Flexible Display Center at Arizona State University) ;
  • Clark, L.T. (Flexible Display Center at Arizona State University) ;
  • Vogt, B. (Flexible Display Center at Arizona State University) ;
  • Bawolek, E.J. (Flexible Display Center at Arizona State University)
  • Published : 2008.10.13

Abstract

Electrical stress degradation of low temperature, amorphous silicon thin film transistors is reviewed, and the implications for various types of flexible circuitry including active matrix backplanes, integrated drivers and general purpose digital circuitry are examined. A circuit modeling tool that enables the prediction of complex circuit degradation is presented.

Keywords