A Novel Design of Low Noise On-panel TFT Gate Driver

  • Deng, Er Lang (Department of Electronic Engineering, Feng Chia University) ;
  • Shiau, Miin Shyue (Department of Electronic Engineering, Feng Chia University) ;
  • Huang, Nan Xiong (Graduate Institute of Electrical and Communication Engineering, Feng Chia University) ;
  • Liu, Don Gey (Department of Electronic Engineering, Feng Chia University)
  • Published : 2008.10.13

Abstract

In this study, we redesigned the reliable integrated on-panel display gate driver that was equipped with dual pull-down as well as controlled discharge-path structure to reduce the high voltage stress effect and realized with TSMC 0.35 um CMOS-based technology before. An improved discharge path and a low noise design are proposed for our new a-Si TFT process implementation. Our novel reliable gate driver design can make each cell of shift register to be insensitive to the coupling noise of that stage.

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