Reduction of Leakage current Generated by Degradation in Organic Thin Film Transistors using Pattern on Pentacene Surface by Atomic Force Microscope

  • Hwang, Hyun-Doo (Dept. of Electronics and Computer Engineering, Hanyang University) ;
  • Kim, Hyun-Suck (Dept. of Electronics and Computer Engineering, Hanyang University) ;
  • Kim, Chang-Ho (Research Institute of Information Display, Hanyang University) ;
  • Kim, Jae-Hoon (Dept. of Electronics and Computer Engineering, Hanyang University)
  • 발행 : 2009.10.12

초록

In this paper, we proposed a simple method of decreasing the off current generated by degradation for improve the electrical characteristics such as mobility and on/off current ratio by making the line patterns on the pentacene surface between the electrodes using atomic force microscope (AFM) lithography.

키워드