한국정보디스플레이학회:학술대회논문집
- 2009.10a
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- Pages.1148-1151
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- 2009
Comparison of Junction Temperature for Top-Emitting Organic Light-Emitting Diodes Fabricated on Different Substrates
- Juang, Fuh-Shyang (Institute of Electro-Optical and Materials Science, National Formosa University) ;
- Tsai, Yu-Sheng (Institute of Electro-Optical and Materials Science, National Formosa University) ;
- Wang, Shun-Hsi (Institute of Electro-Optical and Materials Science, National Formosa University) ;
- Chen, Chuan-Hung (Institute of Electro-Optical and Materials Science, National Formosa University) ;
- Cheng, Chien-Lung (Department Of Electrical Engineering, National Formosa University) ;
- Liao, Teh-Chao (Department of Electro-Optical Engineering, National Formosa University) ;
- Chen, Guan-Wen (Department Of Electrical Engineering, National Formosa University)
- Published : 2009.10.12
Abstract
A self-designed, written in labview, Organic Light-Emitting Diode junction temperature measuring program was used to calculate the internal junction temperature for devices during operation, and an infrared thermometer was used to measure the backside temperature of the device substrate, to discuss the effects of the junction and substrate temperature difference to the characteristics of the device.