Study on vertical wet etching of aluminum metal film for TFT application

  • Published : 2009.10.12

Abstract

Compared with tilt transfer wet station, vertical etching system has a variety of advantages that are 50% space savings, higher throughput, fairly good etch uniformity over an entire glass for thin film transistor application. The aim of the present work is to study on a vertical etching system to improve the process factors. The computational fluid dynamics analysis is used to demonstrate the change of the etch uniformity as a function of tilt angle of the glass substrate.

Keywords