Non-contact critical current measurement using hall probe

Hall probe를 이용한 비접촉 임계전류 측정

Non-contact critical current measurement apparatus was developed using hall probe which measures the magnetic field distribution across the width of superconducting tape. The hall probe consists of 7 independent hall sensors which lie in a line 600 ${\mu}m$. The difference between maximum and minimum magnetic field in the magnetic filed distribution is a main parameter to determine the critical current. As preliminary research, we calculated the magnetic field intensity at the middle sensor, which is a minimum magnetic field and generated by the circular shielding current modeled by Bean model. We confirmed that there are some parameters that affect on the minimum magnetic field; the distance between superconducting layer and hall sensor, the width of superconducting tape, and the critical current distribution across the width of superconducting tape. Among these parameters, the distance between superconducting layer and hall sensor highly influences on the minimum magnetic field.