Direct observation of charge trap density and its spatial distribution in a four-bit/cell SONOS memory using a charge pumping method

• Zhang, Y.J. (Korea University) ;
• An, H.M. (Korea University) ;
• Seo, Y.J. (Korea University) ;
• Kim, H.D. (Korea University) ;
• Kim, B. (Jinju National University) ;
• Kim, J.Y. (Ulsan College) ;
• Kim, T.G. (Korea University)

• 발행 : 2009.02.11

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