Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 2011.07a
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- Pages.21-22
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- 2011
Considerations on correlation between partial discharge and breakdown using void-simulated defect
보이드 모의결함을 이용한 부분방전과 절연파괴와의 상관관계에 대한 고찰
- Lee, Tae-Seong (Daejin University) ;
- Jang, Su-Gil (Daejin University) ;
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Kim, Jeong-Tae
(Daejin University)
- Published : 2011.07.20
Abstract
In this paper, considerations on correlation between partial discharge and breakdown using void-simulated defect, investigating the characteristics of void discharges. For the purpose, the relationship between PDIV(Partial Discharge Inception Voltage) and BDV(BreakDown Voltage) was analyzed. As a result, it is noticed that the higher PDIV, the higer BDV.
Keywords