전장품의 신뢰성 향상을 위한 HALT기법 연구

Recently, the application of electronics in vehicle is increasing, in order to assess the reliability of the electronics, highly accelerated life test is used, highly accelerated life test can assess the reliability of the electronics in the short time. In this study, optimized HALT technique can be applied to the electronics is proposed. The main results are as follows; i) HALT is proceed to the 8-step process. ii) The test mode of HALT is composed of the cold step stress, hot step stress, vibration step stress and combined environments stress. iii) The time dwell is set to at least 20 minutes.