Study of a Protection Technology to the Transient Radiation for the Semiconductors

반도체에 대한 과도방사선 방호기술연구

  • Published : 2013.05.22

Abstract

The electronic equipment which was exposed to high level pulsed radiation is damaged as Upset, Latchup, and Burnout. Those damages has come from the instantaneous photocurrent from electron-hole pairs generated in itself. Such damages appeared as losses of power in military weapon system or of blackout in aerospace equipment and eventually caused in gross loss of national. In this paper, we have implemented a RDC(Radiation detection and control module) as part of the radiation protection technology of the electronic equipment or devices from the pulsed gamma radiation. The RDC which is composed of pulsed gamma-ray detection sensor, signal processors, and pulse generator is designed to protect the important electronic circuits from the pulse radiation. To verify the functionality of the RDC, LM118s which had damaged by the pulse radiation were tested. The test results showed that the test sample applied with a RDC was worked well in spite of the irradiation of the same pulse radiation. Through the experiments we could confirm that the radiation protection technology implemented with RDC had the functionality of radiation protection to the electronic devices.

위 펄스형 방사선에 노출된 전자장비는 전자소자 내부에서 발생되는 전자-정공쌍(EHP)과 이들이 형성한 순간 광전류로 Upset, Latchup, Burn out 과 같은 다양한 피해를 입게 된다. 이와같은 손상은 군무기체계나 우주항공 장비의 경우 군전력 손실이나 장비의 기능정지로 나타나 국가적으로 큰 손실을 초래할 수 있다. 본 연구에서는 펄스형 감마방사선으로 부터 전자장비/소자를 보호하기 위한 방호기술개발의 일환으로 '방사선 감지 및 제어장치'를 구현하고 대표적으로 군장비에 사용되는 전자소자에 대한 기능검증을 시도하였다. 펄스 방사선에 Latchup 및 Burn out 손상특성을 나타내는 LM118 소자에 개발한 '방사선 감지 및 제어장치'를 적용하여 펄스방사선 조사시험을 수행한 결과 LM118이 안전하게 보호됨을 확인하였다.

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