Nano Secondary Ion Mass Spectrometry : A New Approach to the Analysis of Nano Materials

  • Hong, Tae-Eun (Divion of High Technology Materials Research, Korea Basic Science Institute) ;
  • Byeon, Mi-Rang (Divion of High Technology Materials Research, Korea Basic Science Institute) ;
  • Jeong, Eui Duck (Divion of High Technology Materials Research, Korea Basic Science Institute)
  • Published : 2015.05.28