본 논문에서는 매우 짧은 전류펄스에 의해 구동되는 반도체 발광소자의 파장특성을 측정하기 위한 장치를 고안하였다. 이 장치는 600grooves/mm의 회절격자에 초점거리가 275mm인 분광기와 X-Y recorder 그리고 아날로그 분석을 위한 scanning motor와 최대값 검출기가 결합된 증폭기로 구성하였다. 특히, 최대값 검출기는 짧은 펄스 신호를 연속적인 값으로 변환하기 위하여 사용되었다. 이 장치를 이용하여 상용화된 발광다이오드와 AlGaAs/GaAs LD 및 InGaAsP/InP BH-LD를 duty cycle이 0.01인 전류펄스로 구동하면서 그 파장특성을 분석한 결과 약 1
In this paper, a system has been proposed for the measurement of the spectral characteristic of semiconductor light sources driven by very short pulse currents. This system has been constituted a monochrometer of 600 groovedmm grating and of 275 mm focal length, X-Y recorder, scanning motor which enables the system to get the analog data, and amplifier coupled with peak detector. Especially, peak detector was used to convert the short pulse signal to continuous one. In order to verify the resolution with slit width, several slits were made by the hands. By using this system, the spectra of commercial LEDs, AlGaAdGaAs LD, and InGaAsPIInP BH-LD which were driven with pulse current (duty cy$e = 0.01) were measured. From these measurements, it has been shown that the proposed system has about 1 A1
