Microstructure and Electrical Properties in $Ta_2O_5$ doped Pb($Zr_{0.525}Ti_{0.475}$)$O_3$ Ceramics

$Ta_2O_5$를 첨가한 Pb($Zr_{0.525}Ti_{0.475}$)$O_3$ 계의 미세구조와 전기적 성질

  • 이응상 (한양대학교 무기재료공학과) ;
  • 길영배 (한양대학교 무기재료공학과)
  • Published : 1991.05.01

Abstract

The effects of Ta2O3 doping on the microstructure, electrical properties and thermal expansion in Pb(Zr0.525Ti0.475)O3 ceramics were studied. Density, average grain size, electromechanical coupling factor kp and thermal expansion coefficient of unpoled and poled samples were measured as a function of Ta2O5 content. Average grain size was decreased and density increased above 0.6 mol% Ta2O5 addition. In case of 0.2 mol% addition, density showed minimum according to grain growth. Dielectric constant and electromechanical coupling factor kp were the lowest in 0.2 mol% addition increased with Ta2O5 addition.

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References

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