Abstract
A large number of grain boundaries were seen to crack in near-eutectic solder joints of leadless ceramic chip carriers (LLCC's) during thermal cycling at temperature ranges from -$35^{\circ}C$ to +$125^{\circ}C$ with lhr time period. One potential explanation for this type of cracking might be the presence of embrittling species on the boundary. Although there do not appear to be any instances reported in the literature of solders being embrittled by small amounts of contaminating species, the possibility of such an occurrence exists. The potential presence of impurities located at crack surfaces was inspected using Scanning Auger Microprobe(SAM) and it was found that intergranular cracking could be accomplished by the oxidation of the grain boundary. A physical model for fatigue crack growth was introduced, in which grain boundary separation took place under oxidation facilitated by sliding.
1시간 주기로 -$35^{\circ}C$에서 +$125^{\circ}C$까지의 온도 변화에 지배되는 Leadless Ceranic Chip Carriers(LLCC'S)의 Solder접합부에서 균열이 계면을 따라 일어났다. 이런 균열이 계면을 취약하게 하는 어떤 불순물에 의한 것이 아닌지를 Scanning Auger Microprobe(SAM)을 이용해 조사했다. 그 결과 계면을 따라 일어나는 균열이 계면의 산화에 의해 일어날 수 있다는 것이 발견되었고, 그에 따라 산화에 취약해진 계면을 따라 일어나는 이런 종류의 피로 파괴현상에 대한 모델을 제시했다.