An effective fault detection method for k-bounded circuits

k-bounded 회로에서의 효과적인 결함검출 방법

k-bounded circuits are combinational circuits proposed by Fujiwara whose subcircuits are partitioned in a way that they form a tree and have some restricted k inputs respectively. Fujiwara proposed a O($16^{k}m$) fault detection algorithm for k-bounded circuits where m is the number of signal lines in the circuit. This algorithm is very ineffective to be applied to real circuits, even for small values of k. In this paper, it is shown that a single stuck-at fault in k-bounded circuits can be detected in O($2^{k}m$)time, and multiple stuck-at faults are detected in O($4^{k}m$) time by using thable lookup and imput partitionsing.