A Reexamination of the Method of Measuring Internal Loss and Quantum Efficiency in Laser Diodes

레이저 다이오드의 내부손실 및 내부 양자효율 측정법에 대한 재고찰

  • 한영수 (아주대학교 전자공학과) ;
  • 도만희 (한국전기통신공사 연구개발단) ;
  • 김상배 (아주대학교 전자공학과) ;
  • 정상구 (아주대학교 전자공학과)
  • Published : 1994.05.01

Abstract

We examine the conventional method of measuring the internal optical loss using the dependence of the reciprocal external quantum efficiency on the cavity length in laser diodes. It is shown that the implicit assumption of constant internal differential quantum efficiency ${\eta}_{id}$, which has been customarily misinterpreted as internal quantum efficiency ${\eta}_{i}$, is not valid for devices with short cavity length. Therefore, for reliable measurments long cavity data should be used.

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