A Study on the Effect of Device Degradation Induced by Hot-Carrier to Analog Circuits

Hot-Carrier에 의한 소자 외쇠화가 아날로그 회로에 미치는 영향

We used CMOS current mirror and differenial amplifier to find out how the degradation of each devices in circuit affect total circuit performance. The devices in circuit wer degraded by hot-carrier generated during circuit operation and total circuit performance were changed according to the change of each device parameters. To examine the circuit performance phenomena of current mirror, we analyzed three diffent kinds of current mirrors and made correlation model between circuit performance and stressed device parameters, and compare hot-carrier immunity of these circuits. Also we analyzed how the performance of differential amplifier degraded from the initial value after hot-carrier stress incircuit operations.