전자공학회논문지A (Journal of the Korean Institute of Telematics and Electronics A)
- 제32A권12호
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- Pages.198-208
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- 1995
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- 1016-135X(pISSN)
게이트 레벨 천이고장을 이용한 BiCMOS 회로의 Stuck-Open 고장 검출
Detection of Stuck-Open Faults in BiCMOS Circuits using Gate Level Transition Faults
초록
BiCMOS circuit consist of CMOS part which constructs logic function, and bipolar part which drives output load. Test to detect stuck-open faults in BiCMOS circuit is important, since these faults do sequential behavior and are represented as transition faults. In this paper, proposes a method for efficiently detecting transistor stuck-open faults in BiCMOS circuit by transforming them into slow-to=rise transition and slow-to-fall transition. In proposed method, BiCMOS circuit is transformed into equivalent gate-level circuit by dividing it into pull-up part which make output 1, and pull-down part which make output 0. Stuck-open faults in transistor are modelled as transition fault in input line of gate level circuit which is transformed from given circuit. Faults are detceted by using pull-up part gate level circuit when expected value is '01', or using pull-down part gate level circuit when expected value is '10'. By this method, transistor stuck-open faults in BiCMOS circuit are easily detected using conventional gate level test generation algorithm for transition fault.
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