Korean Journal of Materials Research (한국재료학회지)

Materials Research Society of Korea (한국재료학회)
권호 표지

Temperature Dependence of the Electrical Activation Energy and Defect Density in Undoped Amorphous Germanium (a-Ge : H)

비정질 게르마늄(a-Ge : H)의 전기전도 활성화에너지 및 결함밀도의 온도의존성

  • 조우성 (고려대학교 자연과학대학 물리학과) ;
  • 유종훈 (고려대학교 자연과학대학 물리학과)
  • Published : 1995.09.01
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Abstract

The temperature dependence of the dark conductivity was studied on undoped hydrogenated amorphous germanium (a-Ge : H) over the range from 297 to 423 K. The pre-exponential factor $\sigma$$\_$0/ and activation energy E$\_$C/-E$\_$F/ are determined by an Arrhenius plot. The Arrhenius plot of the electrical conductivity shows a kink around the kink temperature and then is composed of two exponential functions. The obtained statistical shift ${\gamma}$$\_$F/ was about 8.65${\times}$10$\^$-3/eV/K and the pre-exponential factor $\sigma$$\_$0/ was about 2$\Omega$$\^$-1/cm$\^$-1/. A temperature dependent defect density is numerically calculated from the conductivity data. A change of the defect density is observed in the factor of about two in the range of the experimental temperature.

수소화된 비정질 게르마늄 (a-Ge : H)에 대해 전기전도율이 297-423K 사이에서 연구되었다. 측정된 전기전도율의 Arrhenius 구성에 의해 pre-exponential 인수 $\sigma$$_{0}$ 및 활성화에너지 $E_{c}$- $E_{F}$가 결정되었다. 튀어오름(kink) 온도의 존재로 인해 전기전도율의 arrhenius 구성이 두 exponential 함수에 의해 표현되었고, 이에 의해 결정된 페르미준위의 통계이동계수 ${\gamma}$$_{F}$는 약 8.65$\times$$10^{-3}$eV/K이었으며, $\sigma$$_{0}$는 약 2$\Omega$$^{-1}$$cm^{-1}$ /이었다. 전기전도율 데이터로부터 결함밀도가 수치해석적 방법에 의해 계산되었고, 결함밀도는 측정된 온도영역하에서 약 2배 정도 변화하였다 변화하였다화하였다

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