Analysis of a basic single-electron logic-cell considering three-dimensional joint probability distribution

3차원 확률분포함수를 고려한 단일전자 기본 논리 셀의 해석

  • 유윤섭 (고려대학교 전자공학과) ;
  • 황성우 (고려대학교 전자공학과)
  • Published : 1996.07.01

Abstract

Detailed analyses have been presentd for a basic single-electron-logic-cell consisting of two single-electron-transistors (SETs) in series. The interconnection between two SETs has been treated as a coulomb island and the joint probability density function of all three coulomb islands (two from the SETs and one form the interconnection) has been exactly calculated. The average number of electrons in each coulomb island and the steady-state ouptut voltage have been calculated and analyzed.

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