References
- Int. J. Electron. v.52 H.Adachi;H.L.Hartnagel
- Thin Solid Filma v.89 W.E.Spicer;S.Eglash;I.Lindau;C.Y.Su;P.R.Skeath
- J. Appl. Phy. v.50 C.M.Garner;C.Y.Su;W.A.Saperstein;K.G.Jew;C.S.Lee;G.L.Person;W.E.Sipcer
- 23rd Annual Proceedings of IEEE Reliability Physics K.H.Kretschmer;H.L.Hartnagel
- Solid-State Electron. v.31 F.Hasegawa;M.Onomura;C.Mogi;Y.Nannichi
- J. Vac. Sci. Technol. v.B1 F.Bartels;L.Surkamp;H.H.Clemens;W.Monch
- J. Appl. Phys. v.75 Y.Hirota
- Appl. Phys. Lett. v.61 Y.Mada;K.Wada;Y.Wata
- J. Appl. Phys. v.72 D.Landlheer;G.H.Y.Yousefi;J.B.Webb;R.W.M.Kwok;W.M.Lau
- J. Appl. Phys. v.58 J.Mssies;J.P.Contour
- J. Vac. Sci. Technol. v.A7 H.J.Kang;Y.M.Moon;T.W.Kang;J.Y.Leem;J.J.Lee;D.S.Ma
- J. Vac. Sci. Technol. v.B6 W.E.Spicer;Z.Liliental-Weber;N.Newman;T.Kendelewieg;R.Cao;C.McCant;P.Mahowald;K.Miyano;I.Lindau
- J. Appl. Phys. v.57 J.A. Van Vechten;J.F.Wager
- J. Appl. Phys. v.65 Y.Hirota;M.Okamura;E.Tamaguchi;T.Hisaki
- J. Vac. Sci. Technol. v.B1 F.Bartels;L.Surkamp;H.J.Clemens;W.Monch
- J. Vac. Sci. Technol. v.A7 Z.H.Lu;C.Lagarde;I.Sacher;J.F.Currie;A.Yelon
- Materials Aspects of GaAs and InP Based Structure V.Svaminathan;A.T.Macrander
- CRC Handbook of Chemistry and Physics, F-220 and B-73 91 92 Robert C. Weast;Mellllvin J. Astle
- J. Electroanal. Chem. v.317 P.Alongue;S.Blonkowski
- Electrochem. Acta v.37 P.Alongue;S.Blokowski;E.Souteyrand
- J. Vac. Sci. Technol. v.B31 Z.Song;S.Shohen;M.Kawasaki;I.Suemune