Journal of the Korean Data and Information Science Society
- Volume 7 Issue 2
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- Pages.295-299
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- 1996
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- 1598-9402(pISSN)
Optimal Plan for Fully Accelerated Life Tests with Three-Step Stress Under Type I Censoring
- Moon, Kyoung-Ae (Donghae Junior College, Department of Office Automation) ;
- Shin, Im-Hee (Kyungpook National University, Department of Statistics)
- Published : 1996.09.30
Abstract
In this paper, optimal change times are determined for fully three-step stress accelerated life tests, which minimize the asymptotic variance for maximum likelihood estimator of logarithm of the failure rate at the usual condition and exponential distribution is given for life time data.
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