ETRI Journal

  • 제19권4호
  • /
  • Pages.363-388
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  • 1997
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  • 1225-6463(pISSN)
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  • 2233-7326(eISSN)
한국전자통신연구원 (Electronics and Telecommunications Research Institute)
권호 표지

Automated Test Generation from Specifications Based on Formal Description Techniques

  • 발행 : 1997.12.31
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초록

This paper describes a research result on automatic generation of abstract test cases from formal specifications by applying many related algorithms and techniques such as the testing framework, rural Chinese postman tour and unique input output sequence concepts. In addition, an efficient algorithm for verifying the strong connectivity of the reference finite state machine and the concept of unique event sequence are explained. We made use of several techniques to from an integrated framework for abstract test case generation from LOTOS and SDL specifications. A prototype of the proposed framework has been built with special attention to real protocol in order to generate the executable test cases in an automatic way. The abstract test cases in tree and tabular combined notation (TTCN) language will be applied to the TTCN compiler in order to obtain the executable test cases which re relevant to the industrial application.

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참고문헌

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