Induction of Mutation of Streptomyces and Yeast by Simultaneous Treatment of Electric Shock and Chemical Mutagen N-Methyl-N'-Nitrosoguanidine

전기충격과 화학적 돌연변이원 N-Methyl-N'-Nitro-N-Nitrosoguanidine의 병행처리에 의한 방선균과 효모의 돌연변이 유발

  • Sun, Jong-Ho (Division of Life Science, The University of Suwon) ;
  • Kim, Jung-Hee (Center for Genetic Engineering Research, The University of Suwon) ;
  • Park, Uhn-Mee (Center for Genetic Engineering Research, The University of Suwon) ;
  • Kim, Keun (Division of Life Science, The University of Suwon)
  • 선종호 (수원대학교 생명과학부, 서울대학교 분자미생물학 연구센터) ;
  • 김정희 (수원대학교 유전공학연구소) ;
  • 박은미 (수원대학교 생명과학부, 서울대학교 분자미생물학 연구센터) ;
  • 김근 (수원대학교 유전공학연구소)
  • Published : 1997.09.01

Abstract

The effect of electric shock (AC 38 Vll.3 cm) on the lethal effect and induction rate of mutation of chemical mutagen N-methyl-N'-nitro-N-nitrosoguanidine (NTG) was examined by using the spores of Streptomyces and the cells of haploid and polyploid yeast strains of Saccharomyccrs. Spores of Sireptomyces were all alive after 180 min of electric shock, hut all dead after 960 min-treatment. When the spores of Streptomyces or the cells of haploid and polyploid yeast were treated with electric shock and NTG, the electric shock increased the lethal effect of NTG; the survival rate of Streptomyces dropped from 72 to 48% after 180 min-treatment and those of haploidand polyploid-yeast decreased from 8 to 3% and 25 to lo%, respectively, after 40 min-treatment. The electric shock also increased mutation rates of Streptomyces and haploid yeast. from 1.8 to 13.6%' after 120 min-treatment and from 2.4 to 4.8% after 40 min-treatment, respectively.

방선균(Streptomyces) 포자와 효모(Saccharomyces) 반수체 및 배수체 세포를 대상으로 전기충격(AC 38V/1.3 cm)이 화학적 돌연변이원인 N-methyl-N'-nitro-N-nitrosoguanidine(NTG)의 세포치사효과와 돌연변이 유발에 미치는 영향을 조사하였다. 방선균의 경우 전기충격 단독 처리로는 180분 처리하였을 때 생존율이 100%이었으나 960분 처리한 경우에는 모두 사멸하였다. 전기충격과 NTG처리를 병행한 바 방성균의 경우 180분 처리시, NTG 단독 처리시보다 생존율이 72%에서 48%로 감소되었고, 반수체 효모의 경우 40분 처리시 8%에서 3%로, 배수체 효모의 경우 25%에서 10%로 각각 감소되었다. 전기충격과 NTG에 의한 영양요구 돌연변이 형성율에 있어서는 전기충격이 NTG에 의한 돌연변이율을 120분 처리 후 1.8%에서, 13.6%로, 반수체효모의 경우 40분 처리후 2.4%에서 4.8%로 각각 증가시켰다.

Keywords

References

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