Crystallinity and electrical properties of 6H-SiC wafers

6H-SiC wafer의 결정성 및 전기적 특성

H-SiC single crystals were successfully grown by the sublimation method and the optimum growth conditions were established. The grown SiC crystals were about 33 mm in diameter and 11 mm in length. The micropipe density of the polished SiC wafers was 400/$\textrm{cm}^2$, and the planar defect density was 50/$\textrm{cm}^2$. Raman spectroscopy and DCXRD analysis were used to examine the crystallinity of Acheson seeds and the 6H-SiC wafers. As a result, the crystallinity of the 6H-SiC wafers was better than that of Acheson seeds. For examination of the electrical properties of the undopped 6H-SiC wafers Hall measurements were applied. According to the measurements the carrier concentration was estimated to be $3.91{\times}10^{15}/\textrm {cm}^3$ and doping type of the undopped. 6H-SiC wafers was n-type.

승화법에 의한 6H-SiC 단결정의 최적 성장조건을 설정하여 고품질의 6H-Sic 단결정을 성장하였다. 성장된 결정의 직경은 약 33 mm, 길이는 약 11 mm였다. 성장된 결정을 절단하여 연마한 후 광학현미경을 이용하여 연마된 SiC wafer의 micropipe density와 planar defect density를 측정한 결과, micropipe density는 400개/$ \textrm{cm}^2$이었고 planar defect density는 50개/$\textrm{cm}^2$이었다. 이 6H-SiC wafer와 기판으로 사용된 Acheson 결정의 결정성을 비교하기 위하여 Raman 분광법과 double crystal X-ray diffraction 분석법이 사용되었다. 이 분석에 의해 승화법에 의해 성장된 6H-SiC wafer가 Acheson seed보다 결정성이 우수하였다. Hall effect 측정법에 의해 불순물이 첨가되지 않은 6H-SiC wafer의 전기적인 특성을 측정하였으며 그 결과 캐리어 농도는 $3.91{\times}10^{15}/\textrm {cm}^3$이었고, n-type이었다.