Bulletin of the Korean Chemical Society

Korean Chemical Society (대한화학회)
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Analytical Characteristics and Applications of Laser Ionization Mass Spectrometry

  • Published : 1997.01.20
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Abstract

We have built a laser ionization mass spectrometer (LIMS) for chemical composition analysis of solid samples, which employs an Nd:YAG laser and a time-of-flight mass analyzer. In this spectrometer, the maximum mass we identified clearly is higher than 2000 amu. A mass resolution of 230 has been achieved at m/z 208 (Pb element) in the linear TOFMS and can be even improved up to 1550 by employing a reflectron. The detection limit is determined to be on the order of ppm for Fe and In. The depth resolution is found to be about 20Å/spectrum with a laser power of 0.5 J/cm2. We also report a preliminary application of the LIMS to identifying impurities resident in several solid samples.

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References

  1. Methods of Surface Characterization v.2 Ion Spectroscopies For Surface Analysis Czanderna, A. W.;Czanderna, A. W.(ed.);Hercules, D. M.(ed.)
  2. Anal. Chem. v.54 Denoyer, E.;Van Grieken, R.;Adams, F.;Natusch, D. F. S.
  3. Laser and Mass Spectrometry Odom, W. R.;Schueler, B.;Lubman, D. M.(ed.)
  4. Anal. Chem. v.59 Wilky, Z. A.;Hercules, D. M.
  5. Int. J. Mass Spectrom. Ion Process v.91 Consalvo, D.;Mele, A.;Stranges, D.;Giardini-Guidoni, A.;Teghil, R.
  6. Microbeam Analysis-1987 Seydel, U.;Lindner, B.;Geiss, R. H.(ed.)
  7. Anal. Chem. v.64 Cotter, R. J.
  8. Anal. Chimica Acta v.85 Cotter, R. J.
  9. Rev. Sci. Instrum. v.49 Gentry, W. R.;Giese, C. F.
  10. ACS SYPOSIUM Series 549 Time-of-Flight Mass Spectrometry Cotter, R. J.;Cotter, R. J.(ed.)
  11. Sov. Phys. JETP v.45 Mamyrin, B. A.;Karataev, V. I.;Shmikk, D. V.;Zagulin, V. A.
  12. Design parameters for a reflectron in Time-of-Flight Mass Spectrometer Manuscript in preparation Im, H.-S.;Shin, D. N.;Chung, K. H.
  13. Int. J. Mass Spectrum, Ion Process v.112 Bosel, U.;Weinkauf, R.;Schlag, E. W.
  14. Anal. Chem. v.59 Vredun, F. R.;Krier, G.;Alurber, J. F.
  15. Im, H.-S.;Yoon, H.-S.;Kim, S. K.