The Reaction of Internal Electrodes with Bi$_2$O$_3$ in Multilayer ZnO Varistor

적층형 ZnO바리스터의 내부전극과 Bi$_2$O$_3$ 와의 반응

  • 김영정 (선문대학교 공과대학 재료금속공학부) ;
  • 김환 (서울대학교 공과대학 재료공학부) ;
  • 홍국선 (서울대학교 공과대학 재료공학부) ;
  • 이종국 (조선대학교 공과대학 재료공학과)
  • Published : 1998.11.01

Abstract

Reactions between Ag-Pd internal electrode materials and{{{{ { {Bi }_{2 }O }_{3 } }} in multilayer chip varistor were in-vestigated. For more than 1 mol%{{{{ { {Bi }_{2 }O }_{3 } }} in varistor composition internal electrode structure was destroyed due to the reaction between internal electrode and{{{{ { {Bi }_{2 }O }_{3 } }} But for typical varistor compositions (below 1 mol% of{{{{ { {Bi }_{2 }O }_{3 } }} content) microstructural changes around the internal electrode were not observed. However SEM-EDS and TEM-EDS analysis showed the uneven distribution of{{{{ { {Bi }_{2 }O }_{3 } }} in the internal electrode which was due to the migration of{{{{ { {Bi }_{2 }O }_{3 } }} to the electorde during sintering. As a results the nonlinear coefficient of multilayer varistor showed very large distribution as well as the breakdown voltage.

Keywords

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