Journal of the Korean Ceramic Society (한국세라믹학회지)

The Korean Ceramic Society (한국세라믹학회)
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A study on the sintering and Dielectric Characteristics of Low Temperature Sinterable $SiO_2-TiO_2-Bi_2O_3-RO$ System (RO:BaO-CaO-SrO) Glass/Ceramic Dielectrics as a Function of $AI_2O_3$ Content

저온 소성용 $SiO_2-TiO_2-Bi_2O_3-RO$계 (RO;BaO-CaO-SrO) Glass/Ceramic 유전체의 $AI_2O_3$ 함량에 따른 소결 및 유전 특성의 변화

  • Yun, Jang-Seok (Dept. of Aviation Materials Engineering, Hankuk Aviation University) ;
  • Lee, In-Gyu (Dept. of Aviation Materials Engineering, Hankuk Aviation University) ;
  • Lim, Uk (Telecommunication Components Research Center, Korea Electionic Technology Institute) ;
  • Cho, Hyun-Min (Telecommunication Components Research Center, Korea Electionic Technology Institute) ;
  • Park, Chong-Chol (Telecommunication Components Research Center, Korea Electionic Technology Institute)
  • 윤장석 (한국항공대학교 항공재료공학과) ;
  • 이인규 (한국항공대학교 항공재료공학과) ;
  • 임욱 (전자부품연구원 통신부품연구센터) ;
  • 조현민 (전자부품연구원 통신부품연구센터) ;
  • 박종철 (전자부품연구원 통신부품연구센터)
  • Published : 1999.12.01
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Abstract

Sintering characteristics and dielectric properties of low temperature sinterable Glass/Ceramic dielectric materials were investigated. The dielectric materials which were developed for microwave frequency applications consist of SiO2-TiO2-Bi2O3-RO system(RO:BaO-CaO-SrO) crystallizable glass and Al2O3 as a ceramic filler. Sintering experiments showed that no more densification occurred above 80$0^{\circ}C$ and bulk density and shrinkage depended on Al2O3 content only. Results of dielectric measurements showed that $\varepsilon$r Q$\times$f and $\tau$f of the material containing 30wt% Al2O3 were 17.3, 600 and +23 ppm respectively. Those values for 45 and 60wt% Al2O3 samples were 11.6, 1400, +0.7 ppm and 7.2, 2000, -8.5 ppm, repectively. The results clearly showed that the Glas/Ceramic materials of present experiment decreased in $\varepsilon$r and increased in $\times$f value and changed from positive to negative value in $\tau$f value with the increasement of Al2O3 content.

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References

  1. Ceramic Transactions v.15 Processing Multilayer Ceramics with Internal Copper Conductors I. Burn;W. C. Poter
  2. Ceramic Transactions v.15 Multilayer Ceramic NPO Capacitors with Copper Electrode H. Mandai;Y. Sakabe
  3. Advances Ceramics v.26 Crystallzable Dielectrics in Multilayer Structures for Hybrid Microcircuits; A Review L. C. Hoffman
  4. National Technical Report v.40 no.1 Low-Dielectric Low Ceramics for Microwave Uses Y. Yokotani(et al.)
  5. Prceeding of International Microelectronics Conference Co-firable Copper Multilayered Ceramic Substrate T. Nishimura;Y. Baba
  6. Electronic-Ceramics K. Komory;S. Yoshida
  7. J. Soc Mat. Sci. Jpn. v.43 no.489 Preparation and Dielectric Properties of$Ba(Zn_\frac{1}{3}Ta_\frac{2}{3})O3-Ba(Zn\frac{1}{3}Nb\frac{2}/{3})O_3$Ceramics Modified with Certain Additives H. Ohuchi(et al.)
  8. J. Ceram. Soc. Jpn. v.103 no.9 Fabrication of Multilayer Capacitors with Silver Internal Electrode and Alumina-Glass Composite Materials F. Uchikoba;S. Nakajima;T. Ito
  9. Am. Ceram. Soc. Bull. v.69 no.7 Glass in Electronic Packaing Application G. Gejger
  10. J. of Hybrid Circuits v.34 Design and Processing Considerations for the Use of a Crystallizing Low Temperature Cofiring Ceramic Tape System with Integratable Passive Components B. Sjling;S. P. Turvey;J. H. Alexander
  11. J. Pat. 8-259263-5 Glassceramics Yudentaizairyo Nippon Electric Corporation
  12. J. Am. Ceram. Soc. v.78 no.3 Role of Donor and Acceptor Ions in the Dielectric Loss Tangent of$(Zr_0.8Sn_0.2)TiO_4$Dielectric Resonator Material N. Michiura;T. Tatekawa;Y. Higuchi;H. Tamura
  13. Am. Ceram. Soc. Bull. v.73 no.10 Micowave Loss Quality of$(Zr_0.8Sn_0.2)TiO_4$ H. Tamura