CMP 가공 메카니즘의 기계적 요인의 규명

Indentification of the Mechanical Aspects of Material Removal Mechanims in CMP

  • 신영재 (한국기계연구원 자동화연구부)
  • 발행 : 2000.10.01

초록

키워드

참고문헌

  1. Solid State Technology Flex-Mount Polishing of Silicon Wafers Bonora, A.C.
  2. Silicon Processing for the VLSI Era-Volume 1: Process Technology Wolf, S.;Tauber, R.N.
  3. Semiconductor International CMP: Suppliers Integrating, Applications Spreading Burggraaf, P.
  4. IEDM Technical Digest v.89 A new Planarization Technique, Using a Combination of RIE and Chemical Mechnical Polish(CMP) Davari, B.
  5. Semiconductor International Planarization by CMP : Forcasting the Future O'Mara, W.C.
  6. Journal of Electronic Materials v.25 Review of Planarization and Reliability Aspects of Future Interconnect Materials Sethuraman, A.R.;Wang, J.F.;Cook, L.
  7. Journal of Electronic Materials v.27 no.10 Mechanical Processes in Chemical-Mechanical Planarization: Plasticity Effects in Oxide Thin Films K. Rajan